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The sensitivity of two beam transmission electron microscope images to the structure of small crystal defects
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  • Auteur(s): Sykes, Lawrence Joseph
  • Date de publication: 1981.
  • Contributeur(s): Biodiversity Heritage Library
  • Collection(s): Biodiversity Heritage Library
  • Catégorie: Others
  • Le sujet(s): Electron microscopy. ,  Materials Science and Engineering thesis Ph. D. ,  Dissertations, Academic--UF--Materials Science and Engineering. ,  Transmission electron microscopes. ,  Crystals--Defects.
  • mots-clés: Transmission electron microscopes. Electron microscopy. Crystals Defects. Materials Science and Engineering thesis Ph. D. Dissertations, Academic UF Materials Science and Engineering.

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